SIF Spring Workshop 2019
In collaboration with FEI, Ames Laboratory's Sensitive Instrument Facility will host a two-day Spring Workshop.
Wednesday, May 22: SIF Fundamentals Day
Join us Wednesday morning for a series of talks about the state of the art and most recent developments in the field.
|Presentations on the State of the Art|
|8:30 am||Welcome (Dr. Matthew J. Kramer, Division of Materials Sciences & Engineering Director)||Spedding Auditorium|
|8:45 - 9:30 am||Methods for Characterizing Difficult Samples in the SEM (Dustin Ellis)||Spedding Auditorium|
|9:30 am||Break||Spedding atrium|
|9:45 - 10:30 am||Challenges in S/TEM Sample Preparation (Dustin Ellis)||Spedding Auditorium|
|10:30 am||Break||Spedding atrium|
|10:45 am||Advances in Transmission Electron Microscope Instrumentation and Techniques (Austin Wade)||Spedding Auditorium|
Wednesday afternoon: SIF Thrill Rides
Geared towards interested or new users, join us for an afternoon of equipment demonstrations and explore the range of capabilities available at the SIF, have a chance to talk to equipment experts, and learn more about working with and at the SIF.
Four concurrent sessions will run on each instrument:
|SIF Fundamentals Thrill Rides|
|1:00 - 1:45 pm|
|1:45 - 2:00 pm||Break|
|2:00 pm - 2:45 pm|
|2:45 - 3:00 pm||Break|
|3:00 pm - 3:45 pm|
|3:45 - 4:00 pm||Break|
|4:00 pm - 4:45 pm|
Space is extremely limited so request your session preferences today! Those who are not yet SIF users will be given priority. Workshop registration ends Sunday, May 12 and final participants will be notified May 15.
Thursday, May 23: Intermediate User Day
Join us Thursday, May 23 for a morning of SIF techniques and demonstrations. Sessions will cover advanced techniques including Precession Electron Diffraction (PED), Focused Ion Beam (FIB) 3D Serial Sectioning, Atomic Leveling TEM Imaging, and Advanced EBSD.
- Advanced EBSD (SEM): This session will cover techniques for performing concurrent nano-scale mapping of structure and chemistry using advanced EBSD techniques, including Transmission Kikuchi Diffraction (TKD).
- Atomic Level Imaging (AC-TEM): This session will discuss techniques for collecting concurrent chemical and atomic structural information at the scale of atoms.
- 3D Serial Sectioning (FIB): This session will cover fully 3D investigation and reconstruction of microstructure and chemistry down to the nanoscale.
- Precession Electron Diffraction (PED) (TEM): The Precession Electron Diffraction session will delve into the ability to do precise nanodiffraction, allowing mapping of crystallographic orientations, phase distributions and solution of complex crystal structures on grains as small as a few nanometers.
|Intermediate User Day|
|7:30 - 8:00 am||Registration and Welcome|
|8:00 - 8:30 am|
|8:30 - 9:15 am|
|9:15 - 10:00 am|
|10:00 - 10:20 am||Break|
|10:20 - 10:50 am|
|10:50 - 11:35 am|
|11:35 - 12:20 pm|
|12:20 - 1:00 pm||Closing remarks and discussion by Dr. Matthew Kramer|
Space is extremely limited so request your session preferences today! Those who are intermediate SIF users will be given priority. Workshop registration ends Sunday, May 12 and final participants will be notified May 15.
SIF Workshop FAQs
What are my transport/parking options getting to the event?
Free parking passes for the SIF workshop will be available at the registration desk. Visit SIF Directions & parking for more information.
Where can I contact the organizer with any questions?
Please email the SIF with any questions.
How will I know what my session schedule is?
We will send you your schedule on May 15. It also will be included in your check-in packet.
I signed up for a certain training but that's not on my schedule - what happened?
We are grateful for all the responses that come in and will do our best to accommodate all users. Please be aware that all workshop requests are considered and we will work to accommodate the most number of users.