FEI Titan Themis Cubed

Aberration Corrected Scanning Transmission Electron Microscope (STEM)

The FEI Titan Themis is an aberration-corrected, monochromated, transmission electron microscope that provides researchers with unrivaled capability to understand the behavior of materials down to the atomic-level. Techniques will include including energy dispersive X-ray spectroscopy (EDS), electron energy loss spectroscopy (EELS), tomography, electron holography and Lorentz microscopy. The Cs corrected STEM captures 0.07 nm resolution. Samples ranging from biological to metals can be run through this instrument since it is designed to be stable over a wide range of energies (80 to 200 keV). (S)TEM can also provide in situ observation of structural and chemical change of materials with external effect, such as temperature, environment, and stress/strain down to the atomic level.

  • Accelerating Voltage: 80, 200 and 300 kV
  • X-FEG high brightness emitter gun
  • Gun monochromater
  • Probe Cs corrector (DCOR)
  • Resolution: STEM: 0.6 angstrom,TEM: 0.2 nm (point resolution)
  • Super-X EDX detector (solid angle: 0.7 srad)
  • GIF Quantum ER (965) system
  • FEI Ceta16M bottom mount camera
  • Tilt Range: ± 40° imaging, ±75° tomography
  • Lorentz mode (2nm resolution)
  • Biprism at selected area aperture plane for electron holography
  • Differential phase contrast STEM capability